Analysis based on
Refractive Index Method
Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !
- High efficiency measurement
- Measuring angles 20° and 60°
- Flexible use with its remote probe
- Range 0-100
- Cost Effective
- For ultra high gloss measurement
- Dual range gloss meter
- Flexible use with its remote probe
- Measuring angle 60°
- Dual range 0-100 and 0-1000
Designed to meet the demands of biologists and research scientists alike, the OpenPlex is a compact surface plasmon imaging system with an accessible platform.
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm
Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.
XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.