EMGA-600W

The HORIBA EMGA-600 is a combined model between ON and H analyzers and determines the oxygen, nitrogen and hydrogen contained in ferrous and non-ferrous metals, semiconductors, electronic materials and so on using the inert gas fusion method.

EMGA-920

This is an oxygen and nitrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology's R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user's requests.

GA-370 Trace Gas Monitor

GA-370 : Continuous and ultrahigh-sensitivity measurement of trace impurities (CO, CO2and CH4) in high-purity gas.

 

GD-Profiler

The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterization and process studies.

GD-Profiler HR

The HORIBA Scientific GD-Profiler HR™ gives the optimum in terms of resolution and number of elements to solve analytical problems even in the most complex matrices.

HE Raman Process Analyzer

High throughput compact rugged spectrograph, suitable for dedicated Raman analysis and portable applications. Available rack mounted for industrial settings.

Highly Sensitive Silica Monitor SLIA-300

Measure the ultra-low density of silica at the finest sensitivity of 0.01 µg/L (0.01 ppb).

IG-320 Gloss Checkers

     

  • High precision measurement
  • Internal memory
  • Average mode
  • Measuring angle 60°
  • Range 0-100
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IG-331 Gloss Checkers
  • High efficiency measurement
  • Measuring angles 20° and 60°
  • Flexible use with its remote probe
  • Range 0-100
  • Cost Effective
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High Gloss Meter IG-410

     

  • For ultra high gloss measurement
  • Dual range gloss meter
  • Flexible use with its remote probe
  • Measuring angle 60°
  • Dual range 0-100 and 0-1000
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