Application
Particle Analysis
Low running costs thanks to a compact design, plus remarkable versatility
For use in combination with Manufacturing Devices. Low-cost reticle/mask particle inspection with enhanced versatility and compactness.
The compact LA-350 uses Mie scattering (laser diffraction) to measure particle size quickly and easily. The speed and ease of this technique makes it popular for most particle sizing applications
Achieves dramatic cost reductions in advanced mask inspections
A range of fiber optic coupled Raman probe heads for remote analysis. Suitable for immersion and high temperature/pressure conditions.
HORIBA Scientific’s triple grating Raman spectrometers offer the ultimate in spectroscopic performance, and are ideally suited for fundamental research and advanced application of chemical analysis using Raman spectroscopy.
Single point analysis and automated hyperspectral imaging.
Dual vacuum modes.
Spot sizes from 1.2 mm to 10 µm.
The simplicity and power of the XploRA PLUS Raman microscope is unmatched and with a broad range of options, the system provides HORIBA’s best Raman microscope to date for multi-sample and multi-user environments.