Thin Film Control & Analysis

High stability and accuracy pressure controller for back side wafer cooling in semiconductor manufacturing, installed piezo actuator valve and pressure sensor.

XelPleX is the ideal solution for label-free and multiplexed molecular interaction analysis.

Single point analysis and automated hyperspectral imaging.

Dual vacuum modes.

Spot sizes from 1.2 mm to 10 µm.

The simplicity and power of the XploRA PLUS Raman microscope is unmatched and with a broad range of options, the system provides HORIBA’s best Raman microscope to date for multi-sample and multi-user environments.