5th International Conference on Spectroscopic Ellipsometry

HORIBA Scientific encourages its Jobin Yvon ellipsometer users to participate to the 5th International Conference on Spectroscopic Ellipsometry -(23-28 May 2010 - Albany, NY USA)

The 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) continues the tradition of previous Conferences by serving as the premier forum for the international community of scientists and engineers working in the field of ellipsometry and related measurement techniques. ICSE-V covers new advances and developments in science, technology, and applications of spectroscopic ellipsometry including the related optical analysis techniques that commonly exploit polarization. ICSE-V will be held at the College of Nanoscale Science and Engineering (CNSE) in Albany, New York.

More information on ICSE V: www.icse-v.org/web/index.php

Show your Work!

HORIBA Scientific encourages its Jobin Yvon ellipsometer users to participate to the 5th International Conference on Spectroscopic Ellipsometry and to submit an abstract.

Abstract Submission

Opens: October 19, 2009

Deadline: December 6, 2009

HORIBA Jobin Yvon Sponsorship

HORIBA Scientific is commited to supporting its Jobin Yvon users giving a poster or an oral presentation.

For sponsorship opportunities, please contact tfd-marketing.sci@horiba.com

For application support, please contact tfd-sales-sci.fr@horiba.com