6th GD Day, September 21, 2012

The “GD day” is the most comprehensive event on analytical GD for material development and gathers HORIBA Scientific users and invited researchers for a one day scientific conference.

Two novelties this year:

  • First, the GD day will take place at the hotel MERCURE PARIS PORTE D’ORLEANS.
    To access:
    •     Underground Station:    Line 4, “Porte d’Orléans” station
    •     Bus: 125, Narbes Ory Station
    •     Urban rail network: RER B, Gentilly station
    •     Parking at Porte d’Orléans
  • Second, a registration fee of 60 euros will be asked payable by cash on arrival. Invoices will be ready and given at that time.

Call for contributions is still open. The program already includes applications on hard disks, PV, engineering surfaces, use of GD for EBSD, various coatings and on new developments (TOFMS, magnetic field, deconvolution etc).

Our international visitors are also invited to visit HJY on the Thursday afternoon to see the instruments in operation, get hands on the latest developments and exchange information about applications, software…

For contribution and/or registration, please send a mail to patrick.chapon@horiba.com.

Preliminary Program

  • Sam Liang, Seagate, USA. “GD OES applications on hard disks. Composition and Thickness of Ultrathin Multilayered films”.
  • Nerea Bordel, University of Oviedo, Spain. Use of magnetic fields. “Magnetically boosted RF GDOES: new perspectives and expectations”.
  • Sebastian Schmitt, Max Planck Institute for the Science of Light, Erlangen, Germany. PV application. “Glow Discharge Techniques in the Analysis of Photovoltaic Materials”
  • Philipp V. Kiruhancev Korneev, Moscow. Institute of Steel and Alloys Russia. Range of applications. “Applicability of RF GDOES for measurements of ultra thin films, dielectric layers, rough and porous thick coatings”.
  • Beatriz Fernandez, University of Oviedo, Spain. New instrument TOFMS. “Depth profile analysis of ultra-low implants and self-assembled nanostructures by Glow Discharge Time of Flight Mass Spectrometry (PPTOMS)”.
  • Ramon Escobar, CSIC Madrid, Spain. Medical coatings. “Silver segregation in biomedical coatings”.
  • Alex Lanzutti & al., University of Udine, Italy. GD and Electrochemistry. Complementary use of RF GDOES and electrochemical micro-cell for the investigation of aluminized steel.
  • Kevin Ogle, ENSCP France. GD and Spectroelectrochemistry. "The alkaline degredation of phosphate conversion coatings: A quantitative investigation using combined GDOES and atomic emission spectroelectrochemistry"
  • Franck Niveau, Cyril Dupuet. Renault France. Automotive. « New coatings replacing phosphatation”.
  • Elia Marin &al University of Udine, Italy. Ti surfaces. “RF GDOES for plasma etching of Ti alloys.
  • Marzouk Kloul, Patrick Chapon. HORIBA Scientific, France. Data Treatment. “Deconvolution of GD Depth profiles”.
  • Thierry Suire, Nitrocraft/Air Liquide France.   « N2 quality, N2 generation »
  • Marianne Penoy, Ceratizit, Luxembourg. GD for SEM. « Use of GD preparation for EBSD investigation of tungsten carbides samples”.
  • Mark Bumiller HORIBA Scientific, France . Nanoparticles. “Nanoparticles in engineering coatings”.
  • R. Escobar CSIC, Madrid, Spain. Interaction GD/Surface. “Nanostructuring surfaces by GD bombardment. Comparison with AFM and SEM.”
  • V. Shemet, FZ Julich, Germany. High temperature corrosion. Title to come.
  • Agnes Tempez, HORIBA Scientific, France, Presentation of the PP TOFMS instrument
  • Célia Olivero, HORIBA Scientific, France, Recent results with the new pulsed source
  • Cedric Renaud, Patrick Chapon, HORIBA Scientific, France, Presentation of the 3D Metal for bulk and depth profile analysis