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Home » Semiconductor » Products » Processes » Semiconductor Process » Material Analysis (Particulates Analysis & Defect Analysis)

Material Analysis
(Particulates Analysis & Defect Analysis)

Material Analysis
(Particulates Analysis & Defect Analysis)
XGT-5000

XGT-5000 X-ray Analytical Microscope

Single point analysis and automated imaging.

Atmospheric pressure analysis.

Spot sizes from 1.2 mm to 10 µm.

LabRAM ARAMIS Raman microscope

LabRAM ARAMIS

Fully automated, fast, sensitive, analytical Raman microscope system.

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