Greetings from your friends at HORIBA Instruments!

Our November newsletter welcomes you to visit our new Nanotechnology web page, download the Application Notes on Monitoring Nanoparticles and Characterizing Fertilizers, download a Technical Note explaining how to monitor stability and determine refractive index with the LA-950 and announce the winners of our Customer Survey iPod drawings!


Monitoring Nanoparticles

Nanoparticles

Monitoring the presence of nano-particles in liquid dispersions with a broad particle size distribution presents a challenge because larger particles could mask nano-particles in many size measuring techniques.  A study using the DT-1201 acoustic attenuation spectrometer investigated how this technique responds to the presence of sub 100 nm zinc oxide.

View the new web page devoted to Nanoparticles.

Application Note AN171 on Monitoring Nano-particles in the Presence of Large Particles using Acoustics (You need to be logged in).


Fertilizers

Fertilizers

Particle size analysis is so important to the fertilizer industry that a minimum frequency of measurements must be made to assure proper quality.  For many years the traditional technique used for particle size analysis of fertilizers has been sieving, but companies are now looking for more efficient, cost effective measurement tools.  Any technique and tool considered for replacing sieving must have the ability to match the historic sieve results, but provide gains in speed, ease of use and the quality of data generated.  The CAMSIZER is just such a tool and has replaced sieve techniques at fertilizer plants around the world.  This Application Note explains how the CAMSIZER has been used in the fertilizer industry to great effect.

Application Note AN172 on Particle Size and Shape Analysis of Fertilizers using Digital Image Analysis (You need to be logged in).


LA-950 Technical Note

The LA-950 software provides two different calculations to quantify both the quality of the raw data and the calculation of particle size distribution:  Chi square and R-parameter.  The calculations can be used to help select the best refractive index value for a sample and also assess the data quality of a measurement.  The technical note explains these two calculations and how they can be used to optimize results generated by the LA-950.

Technical Note TN153 on Understanding the Chi Square and R Parameter Calculations in the LA-950 software (You need to be logged in).


iPod Winners

iPod

A sincere THANK YOU to everyone who contributed their time to complete the Customer Satisfaction Survey, which is an important part of our efforts to continuously improve our products and services.  We conducted a random drawing to award one iPod Touch for every 50 survey responses and the following names were selected:

  • James Kelly, NIST
  • Henry Way, NETZSCH

Upcoming Customer Training Courses

The HORIBA Particle Characterization Group has been steadily expanding our offering of customer training courses.  The next laser diffraction (LA-series instruments) training course will be held in Irvine, California on February 10-11.

Information on "Boot Camp" customer training course registration.

Acesso do utilizador

Digite aqui seu nome de utilizador e senha para entrar no site:

Forgot Password?

Having trouble login in? Please click here and we will send a new password. If you are still having trouble, contact us at web_member@horiba.com.

Not a member yet?

Register and receive access to advanced information, including Application Data Sheets, Application Notes, Brochures, Links to External Articles, Manuals, Software Downloads, Software Updates. When you register you will also receive periodic updates by e-mail. Create a new account.