Development of New X-Ray Spectroscopy using Resonant Inelastic X-Ray Scattering

*Japan Women’s University

We developed a method of determining the X-ray absorption fine structure (XAFS) spectrum through high accuracy measurement of resonant inelastic X-ray scattering, without any limits on resolution of the inner shell lifetime broadening. From this method, we can derive various new types of XAFS, including the valence selective XAFS and the spin selective XAFS (both without any limits of lifetime broadening). The method shows a possibility of developing into a powerful tool to monitor various condition changes for general functional materials.

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