HORIBA at Automotive Testing Expo 2007 China

12 November 2007


HORIBA Automotive Test Systems (ATS) has participated in the Automotive Testing Expo China from 12–14 September 2007. The event was held at Shanghai Everbright Convention and Exhibition Center. This expo not only provided a platform for HORIBA to present its innovations and developments, whilst open up a window for the Chinese consumers to understand the world's leading automotive analysis and measurement technology.

In the three-day event, we have received over a thousand visitors, exchanged views and opinions regarding HORIBA ATS products and technology. HORIBA ATS is confident that we will excel and move forward in this growing market.

For more information on HORIBA Automotive Test Ststems activities in China, please visit www.horiba.com.cn (in Chinese).