HORIBA and Retsch Technology are proud to introduce the new state of the art in dynamic image analysis -- the CAMSIZER XT!

The design of the CAMSIZER XT is based on the well-proven CAMSIZER platform, but is optimized for smaller sizes down to 1 micron.  The uniquely flexible X-Change system of sample handlers allows for both dry powders and wet suspensions to be measured for size and shape between 1 micron and 3 millimeters.

Here's just a snapshot of the features on the XT:

• Simultaneous high-resolution measurement of size and shape
• Image analysis using patented two-camera system
• Very short measurement times from 1-3 minutes
• Intuitive operating software

Visit the CAMSIZER XT page for more information.

Will you be attending this year's Pittcon Conference & Exposition in beautiful Atlanta, Georgia?

Stop by and talk with us at booth 1922 (near Agilent and Waters). Many HORIBA Scientific technologies and technologists will be in attendance including: particle characterization, fluorescence, raman, ICP, glow discharge, water quality, sulfur and chlorine-in-oil, and more.

Our own Mark Bumiller will be giving a presentation entitled "Characterizing Nanoparticles Used in Bio Applications" as part of the State-of-the-Art Technologies from Japan symposium. You can find Mark in room 311 on Tuesday, March 15th at 4:25 PM.

The next entry in our "Introduction" series of webinars is nothing less than the world's most popular and widespread modern sizing technique. This presentation was designed for easy consumption and to be accessible for beginning particle size analysts.

Be sure to join us on Wednesday, March 23rd at 1:30 PM Eastern (10:30 AM Pacific) for a presentation designed to introduce the technique, measurement, and applications of laser diffraction.

Ian Treviranus from HORIBA Scientific will discuss the following topics:

• Why Laser Diffraction is so popular
• Measurement principle
• Common uses that provide benefit to your product or process
• Practical tips and advice

Register to attend the presentation and Q&A about laser diffraction.

Are you using dynamic image analysis (IA) to replace your sieves? Maybe you have a static IA system to supplement your laser diffraction measurements. Or perhaps you're looking for a leg up on your competition or something new to solve an old headache.

Particle shape analysis can provide actionable information to help you improve product quality and process performance. For many users shape is a forgotten "throw-in" compared to the primary sizing capability of their image analyzer. We'll show you the hidden value of shape measurement.

Be sure to join us on Tuesday, April 5th at 1:30 PM Eastern (10:30 AM Pacific) for a presentation designed to introduce the technique, measurement, and applications of laser diffraction.

Jeff Bodycomb, Ph.D. from HORIBA Scientific will discuss the following topics:

• How shape is measured
• How we can describe those shapes
• Guidance to choose the best shape metrics
• Practical tips and advice

Register to attend the presentation and Q&A about particle shape analysis.

The massive popularity and extensive funding for nanotechnology research means the determination of what is and what is not a nanoparticle is now very important.
The "What is a Nanoparticle?" page can help you determine if your material fits the definition.

More information