Spectroscopic ellipsometers are the perfect tools for measuring thin film thickness and optical constants (n and k) with high accuracy for single and multiple layer thin film structures. Thickness determinations range from a few angstroms to tens of microns. Characterization of advanced material properties are also possible such as: anisotropic structures, graded and non-uniform layers, alloy composition.

Standard applications by Spectroscopic Ellipsometry

Thin Film Photovoltaics by Spectroscopic Ellipsometry

Optical Characterization of Organic Semiconductors by Spectroscopic Ellipsometry

High k Dielectric with Nanoscale Thickness Studied by VUV spectroscopic Ellipsometry & FTIR-ATR

Characterization of III-V Semiconductors using Phase Modulated Spectroscopic Ellipsometry

Spectroscopic Ellipsometry of Compound Semiconductors: Al_xGa_1-xN / GaN Hetero-Structures

Ferroelectric Thin Films Characterization by Spectroscopic Ellipsometry PbZr_1-xTi_xO₃ & BA_1-xSr_xTiO₃

Ellipsometric characterization of doped and undoped crystalline diamond structures

Characterisation of LED Thin Film Devices by Spectroscopic Ellipsometry

TFT - LCD Display

Characterization of thicknesses and optical constants of encapsulated OLED devices - Investigation of the aging process of an OLED

PDP - Plasma Display Panel

OLED - Organic Light Emitting Diodes

Characterization of TFT and LTPS TFT-LCD Display Panels

Characterization of Photovoltaic Devices by Spectroscopic Ellipsometry

P3HT:PCBM Bulk Heterojunction Solar Cells Characterization by Spectroscopic Ellipsometry

Characterization of Chalcogenide Glasses

Characterization of ZrO₂ Thin Films on Glass Substrates

Characterization of TiO₂ Thin Films and Multilayer Antireflective Coatings

Determination of the Refractive Index of Y₂O₃ on Glass and Pre-evaporated Substrates by Spectroscopic Ellipsometry

Spectroscopic Ellipsometry study of ZnO thin films

Characterization of Electrochromic Devices by Spectroscopic Ellipsometry

Characterisation of LED Thin Film Devices by Spectroscopic Ellipsometry

Porous Silicon Composite Material

VO2 Smart Materials

Characterization of DNA Sensor Pads using the UVISEL Spectroscopic Phase Modulated Ellipsometer

Ellipsometric Study of the Aggregation of Hydrophobically Modified Polysaccharides in Solution at the Air/Water Interface

Spectroscopic Ellipsometric Measurements on Biochip Structures in a Liquid Flow Cell Environment

Characterization of biotin-avidin system for use of biomaterials by Spectroscopic Ellipsometry

Characterization of thickness and optical constants of a-Carbon films

Characterization of Engineered Nanomaterials

Characterization of barrier layers by Spectroscopic Ellipsometry for packaging applications

Characterization of Aluminum Anodized Surfaces using the MM-16 Spectroscopic Ellipsometer

Characterization of GeSbTe films by Spectroscopic Ellipsometry for Rewritable Optical Discs