
Particle Characterization
Happy New Year from HORIBA Scientific!
The new year started with a bang for our group with the introduction of yet another state of the art product: the CAMSIZER XT. Just like the class-leading LA-950 laser diffraction size analyzer and CAMSIZER dynamic image analyzer before it, the XT will re-write your expectations for particle characterization. Read about it below and see why we're excited.
Also in this edition we invite you to attend a webinar introducing dynamic image analysis, the 2011 LA Boot Camp courses are announced, we talk about nanoparticles, and more. We've covered the macro, micro, and nano in this edition so that everyone has something to read.
New Product: CAMSIZER XT Image Analyzer
HORIBA and Retsch Technology are proud to introduce the new state of the art in dynamic image analysis -- the CAMSIZER XT!
The design of the CAMSIZER XT is based on the well-proven CAMSIZER platform, but is optimized for smaller sizes down to 1 micron. The uniquely flexible X-Change system of sample handlers allows for both dry powders and wet suspensions to be measured for size and shape between 1 micron and 3 millimeters.
Here's just a snapshot of the features on the XT:
- Simultaneous high-resolution measurement of size and shape
- Image analysis using patented two-camera system
- Very short measurement times from 1-3 minutes
- Intuitive operating software
Visit the CAMSIZER XT page for more information.
Webinar: Introducing Dynamic Image Analysis
Have you ever wanted to replace your sieves? Or maybe you just hoped for a measurement that better fits your process and product.
Then mark your calendar to join us on Thursday, January 27th at 1:30 PM Eastern (10:30 AM Pacific) for a presentation designed to introduce the technique, measurement, and applications of dynamic image analysis.
Jeff Bodycomb, Ph.D., from HORIBA Scientific will discuss the following topics:
- Why Dynamic Image Analysis?
- Why replace sieves?
- How does dynamic image analysis work?
- Practical tips and advice
Register to attend and discover this cutting edge technology.
Training Courses: 2011 LA Boot Camp Dates
We are pleased to announce the dates of our 2011 LA Boot Camp training courses. This is a 2-day course aimed at users of our LA laser diffraction analyzers that mixes classroom discussion with hands-on training.
More information
Application Note: Measuring PSL on the PSA300
Static image analysis provides fast, accurate, and repeatable particle size and shape measurements of pharmceutical APIs, metal and oxide powders, and other materials. The PSA300 is a static image analysis instrument that is ideal for particle samples that are difficult to disperse or particles suspended in slurries or pastes. In this application note a standard sample of 10 micron polystyrene latex is characterized with the PSA300 in order to demonstrate the accuracy of the technique.
Click here to download AN193 and many other Application and Technical Notes.
Pittcon 2011 in Atlanta, Georgia
We hope to see you at this year's Pittcon Conference & Exposition in beautiful Atlanta, Georgia.
You can stop by and talk with us at booth 1922 (near Agilent and Waters). Many HORIBA Scientific technologies and technologists will be in attendance including: particle characterization, fluorescence, raman, ICP, glow discharge, water quality, sulfur and chlorine-in-oil, and more.
Our own Mark Bumiller will be giving a presentation entitled "Characterizing Nanoparticles Used in Bio Applications" as part of the Japan Symposia on Tuesday, March 15th at 4:25 PM.
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