Can Raman and AFM measurements be made on the same instrument?

Yes, it is possible to combine Raman and AFM analysis on a single microscope system.

The combination of Raman with an atomic force microscope (AFM) opens up interesting new capabilities and provides new information on sample composition and structure.  Combined Raman-AFM systems can provide topographic sample information on the nanoscale. Combine this with the chemical information obtained from Raman spectral images and a more comprehensive sample characterisation can be obtained.

Techniques such as tip enhanced Raman scattering (TERS) can also be undertaken with such systems, to open up the potential for true nanoscale Raman analysis.

AFMs from most manufacturers can be coupled to Raman microscopes, in a variety of configurations:

Adjacent - For sequential Raman and AFM analysis on the same sample location

Adjacent
For sequential Raman and AFM analysis on the same sample location

On-axis - For combined Raman-AFM and TERS analysis of transparent samples

On-axis
For combined Raman-AFM and TERS analysis of transparent samples

Off-axis - For combined Raman-AFM and TERS analysis of opaque and transparent samples

Off-axis
For combined Raman-AFM and TERS analysis of opaque and transparent samples

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MORE INFORMATION

  • Can Raman and AFM measurement be made on the same instrument?

Yes it is possible to combine AFM and Raman analysis on a single system. Please visit our AFM-Raman platform page for more information on fully integrated solutions by HORIBA Scientific.