X-Ray Fluorescence Analysis
RoHS and ELV Analyzers
The worldwide RoHS, WEEE and ELV directives specify strict limits on the inclusion of Lead, Cadmium, Mercury, hexavalent Chromium, poly-brominated biphenyls (PBB) and poly-brominated diphenyl ethers (PBDE) in materials used within consumer electrical goods and automotives.
- RoHS - Restriction of the use of certain Hazardous Substances in electrical and electronic equipment.
- ELV - End of Life Vehicles.
X-ray fluorescence is the technique of choice for fast, non-destructive screening of manufacturing materials and parts. Analysis times are typically in the order of a few minutes for sensitivity to concentrations below 100 ppm (0.01%).
The XGT systems offer limits of detection as low as 2 ppm (0.0002%). A standard 1.2 mm analysis beam allows even small electrical components and parts to be individually analysed.
XGT-1000WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br).
New line up of XGT-1000WRseries with high performance functions and increased sensitivity. Maintain the same system as XGT-1000WR and high sensitivity type due to new optical system. XGT-1700WR support for WEEE/RoHS, ELV and Chinese RoHS
High sensitivity XRF qualitative and quantitative analysis with an X-ray imaging microscope
XGT-5000WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) and equipped X-ray Microscope Functions
New line up of XGT-5000WR with high performance functions and increased sensitivity. Maintain the same system as XGT-5000WR and high sensitivity type due to new optical system.
XGT-5700WR support for WEEE/RoHS, ELV and Chinese RoHS