XGT-9000

XGT-9000 Expert

X선 분석 현미경(Micro-XRF)

고감도·고속 매핑이 가능하여 분석 시간 단축이 가능합니다.

  • 감도와 공간 분해능을 저하시키지 않는 고감도의 <15 µm 스팟 사이즈
  • 고해상도 카메라와 여러개의 조명으로 고해상도 샘플 이미지 추출 가능
  • 투과상 및 형광 X선 동시 검출
  • C를 비롯한 경원소 검출 가능
  • 고감도 이미지 기술로 전처리가 필요 없으며, 비파괴 원소 분석이 가능
Segment: Scientific
Manufacturing Company: HORIBA, Ltd.

Higher sensitivity and wider detection range by new detection systems

With new advanced detection systems, the XGT-9000 Pro is able to achieve higher sensitivity than before and the XGT-9000 Expert provides you the ultimate performance in sensitivity and the widest detectable element range. Having improved sensitivity reduces measurement time and boost your work efficiency while wider detectable element range expands your application possibilities.

(Left) Cu intensity comparison (Right) Super light elements intensity comparison
[1][2] All the results are compared with XGT-9000 Pro/Expert vs. HORIBA conventional micro-XRF models

 



High quality macro and micro imaging with multiple probe selection

The XGT-9000 Series provides ultimate performance and flexibility with its well designed excitation system, including high output X-ray generator (up to 50 kV and 1000 µA) and a wide selection of probe spot sizes down to 10 microns and up to 1.2 mm. Multi-probes can be installed in the instrument and switchable on the software. It allows high quality fast imaging in macro and micro level without compromising the needs of spatial resolution and measurement time over large map area. Two ultra high intensity probes of 15 µm and 100 µm can be chosen.

Elemental layered images on a Lapis lazuli stone using multi-probes
(Left) Fast scanning using 100 µm ultra-high intensity probe. (Right) Detailed imaging using 15 µm ultra-high intensity probe.

 



Dual types of detectors for fluorescent X-rays and transmission X-rays

The XGT-9000 Series provides dual types of detectors. One is a fluorescent X-ray detector which tells the elemental distribution of a sample, and the other is a transmission X-ray detector which tells the internal structure of a sample. XGT-9000 can get the two types of images of the same area simultaneously. Especially it is helpful for a better understanding of electronics, gemstones including inclusions, and biological specimens.

Simultaneous imaging of elemental image and transmission X-ray image of a printed circuit board
(Left) Elemental layered image revealed a foreign matter stuck under the IC chip. (Right) Transmission X-ray image revealed many voids under the IC chip.

 



High resolution and brilliant optical images

Capturing clear images is critical for micro-XRF analysis. The XGT-9000 series provides high resolution cameras to grasp the image of the whole sample and its details down to the microscopic level. Both images can be zoomed in and out digitally to find the best position to analyze on a sample surface flexibly. In addition, thanks to the multiple illumination systems, you can get brilliant optical images of your target sample.

(Left) Whole image                                                              (Right) Detailed image

High resolution and brilliant optical image of a fly

 



Wide applications of the sample chamber

The XGT-9000 Series accommodates a wide variety of samples such as micro size fragments, printed circuit boards, coins, sheets, powder, liquid, and wafers. Various kinds of sample holders can be provided. In addition, up to 4 measurement environments can be selected to pull up sensitivity.

Wide applications of the sample chamber

 



Flexible and user-friendly software

The XGT-9000 software has a highly flexible and user friendly interface. It displays data tree, optical images, spectrum results, the periodic table, and map imaging results at a glance. Thanks to the flexibility, users can customize the layout on the screen. Moreover, the results can be displayed on multiple monitors. It allows you to see the results more clearly and boost your data analysis.

An example of software layout on dual monitors

 

Apart from the standard software functions, advanced modules can be added to the software suite to provide more comprehensive user experiences.

  • Multilayer FPM module for thickness measurement with/without standard samples
  • RoHS module for RoHS screening
  • Queue module for automated multiple measurements in unattended mode
  • Particle Finding module for particle analysis and co localized analysis
  • LabSpec Link module for data transfer to LabSpec 6 for multivariate analysis


Application  Examples


Product video

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Model
XGT-9000
XGT-9000 ProXGT-9000 CXGT-9000 Expert


Basic information

   Instrument

X-ray analytical microscope
   PrincipleEnergy dispersive X-ray fluorescence spectroscopy
   Detectable elements*F (9) - Am (95)C (6) - Am (95)B (5) - Am (95)
   Available chamber size450 mm (W) x 500 mm (D) x 80 mm (H)
   Maximum mass of sample1 kg
   Maximum mapping area100 mm x 100 mm on 300 mm (W) x 250 mm (D)


Sample observation

   Optical image observationTwo high resolution cameras
   Whole image
   Detailed image
5 million pixels, Field of view: 100 mm x 100 mm
5 million pixels, Field of view: 2.5 mm x 2.5 mm
   Optical designVertical-coaxial X-ray and optical observation
   Sample illumination / ObservationTop, bottom, side illuminations / Bright and dark fields


X-ray generator

   PowerUp to 50 W
   VoltageUp to 50 kV
   CurrentUp to 1 mA
   Target materialRh


X-ray guide tube (Probe)

   Probe spot size selectionVarious probe combination can be offered
(e.g. 15 μm ultra-high intensity probe and 100 μm ultra-high intensity probe can be chosen)


Detectors

   X-ray fluorescence detectorLiquid nitrogen-free Silicon Drift Detector (SDD)
   Transmission detectorNaI (Tl)


Operating mode

   Measurement environmentWhole vacuum
Partial vacuum
Whole ambient
He purge (optional)
Whole vacuum
Partial vacuum
Whole ambient
He purge (optional)
Whole vacuum
Partial vacuum


Instrument dimention (main unit)

   Instrument size680 mm (W) x 860 mm (D) x 760 mm (H)
   Mass weightApproximately 200 kg

*Under whole vacuum condition
 

Dimensions (unit: mm) 

Glass-Filled Ruby Characterization with the XGT-9000, HORIBA’s new micro-XRF
Glass-Filled Ruby Characterization with the XGT-9000, HORIBA’s new micro-XRF
Gemstones for jewelry are treated by heating, irradiation, or filling of cracks to make them flawless. We performed imaging analyses using an XGT-9000 X-ray Analytical Microscope on a ruby provided by Mineralab. The transmission X-ray imaging revealed that the ruby included several internal defects, and the fluorescent X-ray imaging revealed that the ruby surface was treated by filling with Pb, Mg and Si which are representative of lead glass.
Non-destructive thickness and composition analysis of NiP/Au plating on Cu contacts using micro-XRF
Non-destructive thickness and composition analysis of NiP/Au plating on Cu contacts using micro-XRF
We carried out plating thickness and composition analysis on dual-layer NiP/Au plating on Cu contacts on a flexible printed circuit using a HORIBA X-ray analytical microscope. We successfully detected Au of ultra-thin layer without any sample preparation. The thickness results of Au and NiP plating were consistent with the provided values and with good repeatability.
Pigment identification of an old Japanese flag “Hinomaru” using micro-XRF and Raman microscopy
Pigment identification of an old Japanese flag “Hinomaru” using micro-XRF and Raman microscopy
This application note introduces pigment identification using micro-XRF and Raman microscopy on a Japanese flag “Hinomaru”, which is presumed to be the oldest and designed by an ancient Japanese Emperor Go-Daigo. The two spectroscopic analyses identified that the red pigment used on the flag matched the cinnabar ore (Mercury(II) sulfide) mined from the Mine near the place where the Emperor lived.
Spectroscopic Analysis Explains the Mystery of Dragonfly Eye Beads
Spectroscopic Analysis Explains the Mystery of Dragonfly Eye Beads
Spectroscopic analysis can reveal the origin of cultural heritages and the historical background at the time. This application note introduces research of a dragonfly eye bead found in a tomb in China. Using Raman spectroscopy and X-ray analytical microscopy, the bead was found to be from the Eastern Mediterranean region and the result suggested China had cultural and economic exchanges with them during that era.
Optical Micro-spectroscopies on a Path to Identify the Source of Life
Optical Micro-spectroscopies on a Path to Identify the Source of Life
In this article, we present how our Raman and X-Ray Fluorescence microscopies can be combined to shed some light on the origins of the universe. We show some examples on a meteorite piece and on water inclusion in quartz matrix.
Non-destructive Failure Analysis on Electronic Components Using the XGT-9000
Non-destructive Failure Analysis on Electronic Components Using the XGT-9000
μ-XRF is a non-destructive analytical technique which can inspect defects, even non-visible ones, inside a sample because of the high penetration of X-rays. This application note introduces failure analysis to detect ion migration, voids, and foreign matter on electronics using the XGT-9000, with key features of the vertical irradiation of a 10 μm probe and the simultaneous imaging of fluorescent X-rays and transmission X-rays.
Multiple Characterizations of a Blister Pack Using the XGT-9000
Multiple Characterizations of a Blister Pack Using the XGT-9000
The XGT-9000 is HORIBA’s new X-ray microscope. Its analytical versatility allows, multiple characterizations to be performed on a blister pack, from mapping of the full pack to particle size measurements of the capsule content.
Characterization of Pyrite Inclusions in Lapis Lazuli Using X-ray Fluorescence Micro-imaging
Characterization of Pyrite Inclusions in Lapis Lazuli Using X-ray Fluorescence Micro-imaging
Lapis lazuli is a deep-blue metamorphic rock used as a semiprecious stone which contains inclusions that can impact its value. Pyrite impurities and major elements distribution are studied with the XGT-9000, HORIBA’s new X-ray microscope.
Elemental Distribution Imaging on Edible Insects Using Micro-XRF
Elemental Distribution Imaging on Edible Insects Using Micro-XRF
Edible insects have received attention as a possible solution as a supplemental source to reduce food insecurity because of their nutritional benefits such as protein, fat, and minerals. Micro-XRF can be used to understand the elemental distributions in insects non-destructively. In this application note, we carried out elemental map imaging on edible crickets using a HORIBA XGT-9000 X-ray analytical microscope and revealed the rich source of zinc in their jaws.
Foreign Matter Analysis in Food using the XGT 9000
Foreign Matter Analysis in Food using the XGT 9000
This application note introduces foreign matter analysis in food products using the XGT 9000. There are three analyses as follows: Foreign particles on an oily salami, foreign matter inside a laminated ham and sausage, and a fly found in a drink product.
The non-destructive identification of black ink in a tempered document using XGT-9000
The non-destructive identification of black ink in a tempered document using XGT-9000
μ-XRF is one of the powerful non-destructive analytical technique in forensic science application. Thanks to the elemental mapping and the spectrum search function, XGT-9000 enables to reveal intentional alternation and identify the ink used on a document.
QC of Semiconductors which Feature Thin and Narrow Patterns
QC of Semiconductors which Feature Thin and Narrow Patterns
The combination of microbeam and thickness measurement capability makes the XGT-9000 a useful tool for the QC of semiconductors, which feature thin and narrow patterns. Thickness sensitivity depends on elements traced, but can be at the Angstrom level.
QC, Counterfeit Products, Presence of Foreign Materials
QC, Counterfeit Products, Presence of Foreign Materials
X-ray Fluorescence photons can be partially absorbed by the encapsulated material and will not show in the spectrum. The X-ray transmission image provides a complete picture.
Foreign Particle Analysis on a Separator Film of Lithium-ion Battery
Foreign Particle Analysis on a Separator Film of Lithium-ion Battery
The XGT-9000 can detect and determine the composition of foreign particles, and therefore track the source of contamination.
Failure analysis, RoHS testing of Electronics
Failure analysis, RoHS testing of Electronics
Simultaneous imaging of transmission X-rays and fluorescent X-rays is effective to find defects inside electronic components.
Surface Analysis of Corrosion/Contamination for Material Science
Surface Analysis of Corrosion/Contamination for Material Science
Elemental distribution is crucial for material science. The XGT-9000 Series provides this information non-destructively.
Elemental Composition Identification of Geoscience/Mineralogical Samples
Elemental Composition Identification of Geoscience/Mineralogical Samples
The XGT-9000 Series can be equipped with various probes and spot sizes providing comprehensive and detailed understanding of geological and mineral samples.
Trace Evidence Identification, Fake Product Identification of Forensic Samples
Trace Evidence Identification, Fake Product Identification of Forensic Samples
The XGT-9000 Series can be used for identification of trace evidences such as collected gunshot residues, glass fragments, and fibers with sizes even down to tens of micron.
Metabolism Investigation of Biological Samples
Metabolism Investigation of Biological Samples
The XGT-9000 Series can be used for identification of trace evidences such as collected gunshot residues, glass fragments, and fibers with sizes even down to tens of micron.
Gun Shot Residue analysis using X-ray fluorescence micro-analysis
Gun Shot Residue analysis using X-ray fluorescence micro-analysis
Micro-XRF analysis of gun shot residues allows individual microscopic particles to be characterized for elemental composition. In addition, automated element imaging provides high spatial resolution element distribution maps, allowing particle shapes and sizes to be accurately analyzed.
X-ray micro-analysis for pearl characterisation in forensic science
X-ray micro-analysis for pearl characterisation in forensic science
Simultaneous XRF and transmission x-ray imaging provides valuable insight into the composition and structure of pearls. Such information is vital for customs officials, who can quickly determine whether pearls are natural, cultured or imitation.
Fingerprint imaging with micro-XRF
Fingerprint imaging with micro-XRF
High spatial resolution elemental mapping experiments are demonstrated to provide a useful method of fingerprint analysis in situations where traditional methods struggle. Fingerprints on glossy paper and finely woven fabrics have been chemically treated, and subsequently imaged.
Micro-XRF analysis for lead contamination in toys
Micro-XRF analysis for lead contamination in toys
A plastic toy is analysed for the presence of lead within its many components. Spot analysis shows concentrations of this harmful element can reach as high as 0.3%. XRF imaging allows its distribution across the toy to be quickly characterised.
Fast thickness measurement of thin metal coatings by Micro-XRF
Fast thickness measurement of thin metal coatings by Micro-XRF
The penetrating nature of EDXRF analysis allows multi-layered samples to be characterised with a single measurement. With high spatial resolution even microscopic features such as bonding pads on circuit boards can be interrogated for composition and layer thickness.
Quality control and defect analysis in the electronics industry using micro-XRF
Quality control and defect analysis in the electronics industry using micro-XRF
Troubleshooting and defect analyses of components embedded within opaque resins are described, on both individual components and complete circuit boards. Quantitative analysis to the ppm level is ideally suited for ensuring compliance to the WEEE/RoHS directives.
Micro-XRF analysis for the Electronics Industry
Micro-XRF analysis for the Electronics Industry
The combination of the XGT-5000’s ground breaking spatial resolution and sensitivity means it is the instrument of choice for fast analysis of electronic components, whether for analysis of restricted harmful elements (the WEEE/RoHS ‘lead free’ legislation), trouble shooting, or R&D.
Elemental analysis of single rice grains using XRF micro-analysis
Elemental analysis of single rice grains using XRF micro-analysis
Individual rice grains are analyzed by micro-XRF to examine the effect of grain polishing. The concentration of mineral elemnts found on a grain can be related to the degree of polish.
Elemental micro-analysis of leaves using EDXRF
Elemental micro-analysis of leaves using EDXRF
Calcium micro-nodules are identified within mulberry leaves, and XRF mapped imaging provides a correlation between nodule concentration and leaf age. In a seperate study, the uptake of heavy element pollutants by plants is investigated, with high resolution images quickly acquired to show the distribution of lead through the leaf.
Biological applications of XRF microscopy
Biological applications of XRF microscopy
The effect of zinc on gastric ulcer healing has been investigated - mapped imaging of tissue samples shows evidence of zinc accumulation within the ulcerated tissue. In a separate study a fish otolith ('ear bone') has been analysed to reveal its heterogeneous elemental composition and physical structure.
Micro-XRF for non destructive analysis of museum and archaeological objects
Micro-XRF for non destructive analysis of museum and archaeological objects
Pigments used in an ancient Nepalese manuscript have been analysed and assigned and an ancient glass burial ornament has been probed to identify the specific colouring additives used.

제품 문의

HORIBA제품의 자세한 정보를 원하시면, 아래의 양식에 내용을 입력을 부탁드립니다.

* 는 필수입력항목입니다.

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