Particle Characterization
30 - Seminars & Webinars
Greetings from your friends at HORIBA Instruments!
Our latest edition welcomes you to visit us at our seminars in Boston on June 2, Campinas, Brazil June 8, Rio de Janeiro June 9, and Buenos Aires June 10, attend a Webinar on choosing a laser diffraction sampler on June 3 and a webinar on particle characterization of abrasives on June 17 and attend the next customer training course in Edison, NJ.
HORIBA Seminars
Boston
On Wednesday June 2 we will hold a joint seminar with Microfluidics from 8:30 - 3:30 entitled "Nanomaterials Processing and Analysis" at their headquarters in Newton, MA.
Talks presented at the seminar include:
- Uniform and Scalable Particle Size Reduction Using High Shear Fluid Processors
- Particle Characterization Techniques and Method Development
- Bottom-up Nanoparticle Creation for Continuous Manufacturing Using MRT
- Characterizing Parenteral Drugs Using Dynamic Imaging Particle Analysis
- Microfluidizer Processor Application for the Nanoemulsion Delivery of Pharmaceuticals, Nutraceuticals and Cosmeceuticals
The full-day educational agenda features interactive presentations and is highlighted by a discussion of nanoemulsion delivery applications by Robert Nicolosi, Ph.D., of the Department of Clinical Laboratory & Nutritional Sciences at University of Massachusetts Lowell.
Click here to register
Brazil
Technical seminars will be held in Campinas on Tuesday, June 8 and Rio de Janeiro on Wednesday, June 9 in cooperation with our distributor Radchrom.
Argentina
A technical seminar will be held in Buenos Aires on Thursday, June 10 in cooperation with our distributor D'Amico Sistemas.
Webinar on Choosing a Sampler for your Laser Diffraction Analyzer June 3
Please join us for our web-based seminar (or Webinar) Thursday, June 3rd at 2 PM Eastern (11:00 AM Pacific) on choosing a sampler for your laser diffraction analyzer. The presenter will be Ian Treviranus.
Topics covered include:
- Sampler volume consideration
- Wet vs. dry measurements
- Unique HORIBA samplers
Click here to register. As always, attending the Webinar is easy and free of charge. We will be glad to help you understand how to attend.
Webinar on Particle Characterization of Abrasives June 17
Please join us for our web-based seminar (or Webinar) Thursday, June 17th at 2 PM Eastern (11:00 AM Pacific) on particle characterization of abrasives. Both the size and shape of abrasive particles play an important role in how they function. This presentation will describe how abrasives can be fully characterized using the PSA300 image analysis system. The presenter will be Mark Bumiller.
Topics covered include:
- Image analysis theory
- Sample preparation
- Optimizing a routine
- Custom calculations for abrasives
Click here to register.
Upcoming Customer Training Courses
The HORIBA Particle Characterization Group has been steadily expanding our offering of customer training courses. The next laser diffraction (LA-series instruments) training courses will be held in Edison, NJ, June 8-9.
Announcing FluoroFest 2010 hosted by HORIBA
Experience state-of-the-art fluorescence instrumentation with hands-on sessions, listen to internationally known experts in the field and share their insight on topics of current interest; biomedical research, nanotechnology and materials science. This symposium is sponsored by HORIBA Scientific, whose integrated brands include the most storied names in fluorescence instrumentation: Spex, IBH, SLM-Aminco, Jobin Yvon and ISA.
Other State of the Art HORIBA Technologies
HORIBA offers a wide range of analytical technologies beyond particle characterization. Many of our customers are also interested in some of these other techniques. In this newsletter we invite interested scientists to investigate our glow discharge systems. HORIBA provides spectrometers for the surface, depth profile and bulk analysis of both conductive and non-conductive samples with Radio Frequency Glow Discharge sources (RF-GD-OES). It is an extremely fast technique and easy to operate. GDS is the ideal tool to investigate from the surface down to more than 150 microns with a depth resolution that can be as good as 1 nm.
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