Ellipsometers

See us at

  • 9th Workshop Ellipsometry, Enschede, The Netherlands, 23-25 February
  • American Physical Society (APS), San Antonio, TX, Booth 335, March 2-6
  • Materials Research Society (MRS) Spring, San Francisco, CA, Booth 500, April 6-10
  • Society of Vacuum Coaters (SVC), Santa Clara, CA, April 28-29
  • 2015 EMRS Spring Meeting, May 11-15, Lille, France
  • Photovoltaics Specialists Conference (IEEE-PVSC), New Orleans, LA, Booth 402, June 14-19
  • American Vacuum Society (AVS), San Jose, CA Booth 429, Oct 18-23
  • Materials Research Society (MRS) Fall, Boston, MA, December 1-3

Spectroscopic Ellipsometry

Product

Title

Link

New UVISEL2

The Ultimate Solution to Every Challenge in Thin Film Measurement

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Smart SE

The Smart SE is an innovative spectroscopic ellipsometer for easy,fast and accurate characterization of single and multi layers thin films.

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UVISEL

Uvisel Spectroscopic Phase Modulated Ellipsometer

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 Auto SE

The simple solution to measure Thin Films

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Spectroscopic Ellipsometry Solutions

Spectroscopic Ellipsometry : A Full Range of Solutions

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In-Situ, In-Line and Large Area Ellipsometers

UVISEL In-Line Spectroscopic Ellipsometer

In-Line Quality Control of Thin Film Coating

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