See us at

  • 9th Workshop Ellipsometry, Enschede, The Netherlands, 23-25 February
  • American Physical Society (APS), San Antonio, TX, Booth 335, March 2-6
  • Materials Research Society (MRS) Spring, San Francisco, CA, Booth 500, April 6-10
  • Society of Vacuum Coaters (SVC), Santa Clara, CA, April 28-29
  • 2015 EMRS Spring Meeting, May 11-15, Lille, France
  • Photovoltaics Specialists Conference (IEEE-PVSC), New Orleans, LA, Booth 402, June 14-19
  • American Vacuum Society (AVS), San Jose, CA Booth 429, Oct 18-23
  • Materials Research Society (MRS) Fall, Boston, MA, December 1-3

Spectroscopic Ellipsometry





The Ultimate Solution to Every Challenge in Thin Film Measurement

Request Brochure

Smart SE

The Smart SE is an innovative spectroscopic ellipsometer for easy,fast and accurate characterization of single and multi layers thin films.

Request Brochure


Uvisel Spectroscopic Phase Modulated Ellipsometer

Request Brochure

 Auto SE

The simple solution to measure Thin Films

Request Brochure

Spectroscopic Ellipsometry Solutions

Spectroscopic Ellipsometry : A Full Range of Solutions

Request Brochure

In-Situ, In-Line and Large Area Ellipsometers

UVISEL In-Line Spectroscopic Ellipsometer

In-Line Quality Control of Thin Film Coating

Request Brochure