See us at
- American Physical Society (APS) - 3-5 March, Denver
- 8th Workshop Ellipsometry -10-12 March 2014, Dresden, Germany
- Materials Research Society (MRS) - 22-23 April, San Francisco, CA
- Graphene 2014, 6-9 May, Toulouse, France
- EMRS 2014 Spring Meeting - 27-29 May 2014, Lille, France
- Society of Vacuum Coaters (SVC) - 6-7 May, Chicago
- Photovoltaics Specialist Conference (IEEE-PVSC) - 8-13 June, Denver
- ISFOE 2014, 7-11 July, Thessaloniki, Greece
- Matériaux 2014, 25-27 November, Montpellier, France
Thin Film Quality Control
Fully automatic analysis of your thin film samples with simple push button operation. Control thin film thickness, optical constants, surface roughness, and thin film uniformity.
Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !