Sample Analysis by Application Experts

HORIBA has a long-standing commitment to complimentary sample analysis towards the evaluation of a particle size, particle shape, surface area, or zeta potential analyzer. Each submission is measured by a highly-trained member of the Applications Lab and presented as a formal lab report complete with method, observations, results, and data interpretation assistance. To get started with your sample analysis, please contact us at labinfo@horiba.com.


Sample Submission Forms

LA-Series: Particle Size Analysis from 10 nanometers to 5 millimeters

CAMSIZER, CAMSIZER XT, and PSA300: Particle Size & Shape Analysis from 1 micron to 30 millimeters

SZ-Series: Nanoparticle Size & Zeta Potential Analysis from 1 nanometer to 8 microns

SA-Series: Surface Area Analysis


Commitment to Application Expertise

HORIBA’s experienced staff of technical and applications specialists support users in 54 offices across 45 countries We are committed to the satisfaction of our users and to the education of the greater industry and provide many channels of support including:

  • Sample analysis via the many Applications Lab around the world Free software updates
  • Webinars, Technical notes, and much more in the Download Center
  • Instant support via phone, e-mail, and online meeting
  • On-site and in-house user training courses
  • Service contracts, verifications, and validations to fit every requirement
  • Advanced software tools to correlate data from other particle size analyzers to maintain historic specifications
HORIBA supports particle characterization applications in 54 offices in 45 countries
HORIBA supports particle characterization applications in 54 offices in 45 countries

Particle Analyzer Product Pages

LA-960

The LA-960 uses Mie Scattering (laser diffraction) to measure particle size of suspensions or dry powders. The speed and ease-of-use of this technique makes it the popular choice for most applications.

SZ-100 Nanopartica Series Instruments

Industry's widest range and highest precision measurement instrument for Nanoparticle characterization.

LA 300

The LA-300 uses Mie Scattering (laser diffraction) to measure particle size of suspensions. The speed and ease-of-use of this technique makes it the most popular for many applications.

CAMSIZER Dynamic Image Analyzer

The CAMSIZER features dynamic image analysis to provide rapid and precise particle size and particle shape distributions for dry powders and bulk material in the size range from 20µm to 30mm.

CAMSIZER X2 Dynamic Image Analyzer

The CAMSIZER X2 features dynamic image analysis to provide rapid and precise particle size and particle shape distributions for dry powders and wet dispersions in the size range from 0.8 µm to 8mm.

PSA300

The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high resolution camera creates an intuitive, easy-to-use imaging workstation.

SA-9600 Surface Area Analyzer

HORIBA's breakthrough SA-9600 Series brings exceptional convenience and confidence to surface area and pore volume analysis. Now you can perform single-point surface area, multi-point surface area and total pore volume measurements with push-button ease.