Sub-micron Photoluminescence and Raman measurements

Photoluminescence

Photoluminescence (or PL) is a spectroscopy technique providing information on electrical and optical properties of semiconductor materials, such as bandgap, emission wavelength, crystallinity and crystal structure, defects etc...

A PL microscope is a laser based instrument measuring optical luminescence emission from materials excited with energy above their bandgap.

HORIBA Scientific micro-PL mapping systems are used to image small features made out of those semiconducting materials, such as diodes or nano structures like Gallium Nitride (GaN) or Silicon (Si) nanowires, Carbon Nanotubes etc…

Since the Photoluminescence Microscope systems are based on HORIBA Scientific leading Raman spectrometer systems, Raman studies can also be conducted on the same instrument.

Raman Spectrum
Picture: Raman spectrum of the diode matrix

Photoluminescence Mapping systems from HORIBA Scientific are used for research or production environments, and can be fitted with temperature controlled cells (LN2 or He cryostats) to measure photoluminescence emission at low temperature. This technique usually helps getting clearer information, from sharper spectral features.

PL Spectrum

The data provided here shows the spectra of different areas of the diode structure, Raman providing information on the stoichiometry of the different elements, while Photoluminescence provides information on the emission wavelength and other optical and electrical properties.

The combination of both techniques on a single instrument provides more information and a better understanding of the devices characteristics.