Element Imaging

An imaging XRF system combines automated sample movement with fast EDXRF elemental analysis. The sample is rapidly scanned through the X-Ray beam, and spectra are continuously read from the detector and correlated to a particular position on the sample.

The distribution of a particular element can be displayed by plotting an image of the element's peak intensity at each pixel position. The result are detailed false colored images showing areas of high and low concentration for each chosen element.

Since EDXRF captures a spectrum with information from all detectable elements simultaneously, multiple elements can be imaged without any time disadvantage.

Modern micro-XRF imaging systems such as the XGT-5000 or XGT-7000 can allow acquisition of images over areas ranging from around 0.25mm2 through to 10 cm x 10 cm or larger. Thus it is possible to analyze samples with a wide range of sizes, both on the macro and micro scale.

Element Imaging