Thin Film Analyzer

For fully-automated measurement of a broad range of films, from 1 nm ultra-thin film to complex multilayer structures

Visualize your sample and measure thin film thickness and optical constants in seconds.

"With Auto SE, routine work will never be the same!"

Spectral range: 430 - 850 nm

Spectral range: 515 - 1000nm (NEW)

Easy-to-use, rapid and versatile spectroscopic ellipsometer.

Products: UVISEL VIS: 210-880 nm | UVISEL FUV: 190-880 nm | UVISEL NIR: 245-2100 nm | UVISEL ER: 190-2100 nm | UVISEL VUV: 142-880 nm

Measure thin film thickness and optical constants. For research and process development.

For the evaluation and analysis of various thin films in constantly evolving Flat Panel Display (FPD) production processes