
Simple Thin Film Measurement with the Auto SE
1 March 2008
HORIBA Jobin Yvon introduces the AUTO SE, a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.
Sample analysis takes only a few seconds and provides a complete report of film thicknesses, optical constants, surface roughness, and film inhomogeneities.
The Auto SE is a highly featured instrument that includes an automatic XYZ stage, real-time imaging of the measurement site and automatic selection of spot size. Many accessories are available to suit a large range of applications.
The Auto SE includes built-in diagnostic indicators for the automatic detection and diagnosis of problems, with comprehensive operator guidance for troubleshooting.
The Auto SE is a turnkey instrument ideal for routine thin film measurement and device quality control.
For further information about this press release, you can send an e-mail request by clicking here.
Click here for further product information.
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