Introducing the Most Advanced X-ray Analytical Microscope, the Model XGT-7000V

August 28, 2007


HORIBA, Ltd., has developed a top-of-the-line X-ray analytical microscope, the model XGT-7000V, that uses an X-ray beam for specimen elemental analysis and optical observation concurrently, in a nondestructive manner.
The device will be introduced to the market on August 29, 2007.
With a newly equipped vacuum specimen chamber and a diametric resolution of 10 µm, the new model features up to 6 times greater sensitivity to light elements of microscopic substances than is found in conventional models.
The device is ideal for foreign substance detection and defect analysis of medicines, foodstuffs and electronic parts.


Equipped with HORIBA's original X-ray collimation technology (X-ray guide tube), the XGT series X-ray analytical microscopes achieve the world's highest level of resolution (10 µm) and are suitable for optical observation, elemental analysis and transparent internal analysis of specimens. Thanks to these outstanding features, the XGT series is widely used for quality control applications, including foreign substance detection and defect analysis of medicines, foodstuffs and electronic parts.
The newly developed analytical microscope, model XGT-7000V, is an upgraded version of the conventional high-performance XGT-5000, which is suitable for two-dimensional (by mapping) analysis and optical observation of specimens ranging from a minimum diameter of 10 μm to a maximum area of 10 x 10 cm. The XGT-7000V has been upgraded by additionally installing a vacuum specimen chamber to enable analysis of sodium (Na) and other light elements at a maximum sensitivity up to 6 times greater than that of the XGT-5000. Light element analysis is important for locating the sources of dust and sweat that may adhere to or enter products during production. In addition to its enhanced analytical capability, the new model reduces analysis time to 10 minutes from the conventionally required one hour.
In addition to providing the world's highest level of performance, the XGT-7000V is also equipped with a navigation system for enhanced operability. The mapping function has also been upgraded to improve functionality.


<Major Advantages>
1. Introduction of a dual vacuuming system enhances sensitivity to light elements.

Use of specimen-chamber vacuuming mode in addition to the conventional vacuuming mode (X-ray optical system in vacuum) enables analysis of specimens in the mode most appropriate for their properties.
(Sensitivity enhanced 6 times for Na, 3 times for Mg, and twice for Al as compared with other models currently on the market.)

2. Operations are supported by a navigation system.
The operation flow chart is continually displayed in a navigation window to indicate the position of the present work in the overall analysis procedure. This navigation system will lead to the final analysis result even if user is unfamiliar with the analysis work steps.

3. Multiple analysis options are available in a single cycle of operation (Smart Map function).
Information on all elements is stored during the mapping process, obviating the need for repeat measurements when changing compositions and elements to be analyzed. The XGT-7000V is thus ideal not only for spectral analysis, but also for analyzing a wide variety of mapping results in various ways.


<Examples of Applications>
[Electronic parts] Defect analysis, foreign matter analysis etc.
[Foodstuffs and medicines] Foreign matter analysis etc.
[Organisms and biological samples] Tissue observation etc.
[Mineral resources and antiques] Nondestructive analysis etc.
[New materials and composite materials] Research and development etc.


<Main Specifications>
Measurable elements: Sodium (Na) to Uranium (U)
Resolution: 10 µm/100 µm
Max. measurable area: 100 x 100 mm
Outside dimensions (body): 670 (W) x 820 (D) x 760 (H) mm