Introduction of Specialized Equipment for European Environmental Directives Detects hazardous substances in electronic components with the highest sensitivity

November 18, 2002


Horiba, Ltd. (head office: Kyoto, Japan; CEO: Atsushi Horiba) has developed the new XGT-1000WR fluorescent X-ray testing equipment that can detect hazardous elements such as cadmium and lead in electronic components. The company will start taking orders on 20 November 2002. With the latest X-ray beam technology, this equipment is the best of its kind in the industry, capable of detecting hazardous elements in the smallest objective area (1.2 mm) and at the highest sensitivity (cadmium sensitivity 2 ppm). Ideal for on-site quality control, this specialized equipment was developed to meet the rapidly-growing need for materials analysis as the European Union’s directives on the use of hazardous substances in electrical and electronic equipment enters into effect. Horiba is aiming for the top share in the expanding electronic component detection market by offering this high-performance, easy-to-operate product.

Main Features

1. Detection capabilities for the smallest objective area (1.2 mm) and of the highest sensitivity (cadmium sensitivity of 2 ppm) in the industry are possible. There is no need for large amounts of sampling material.
2. Simple operation
Anyone can obtain identical measurement results simply by setting the sample in place and pushing the button.
A CCD camera (50-times magnification) makes it easy to identify the point of measurement.
3. Straightforward analysis of any item is possible, from cables to television casing.
The unit is capable of measuring large samples without the need for cutting to size.

Possible Applications
Detection of hazardous elements contained in components of home electronics equipment, IT devices, toys, electrical motor-driven devices, automatic vending machines, etc.

Price Range
10.5-12.0 million yen

Annual Sales Target
50 units in the first year

Specifications
Main detectable elements: Cadmium (Cd), lead (Pb)
Detectable elements: Silicon (Si) to uranium (U)
Scanning region: 1.2 mm diameter
Minimum detection: 2 ppm (cadmium)
External dimensions: 610 mm (W) X 750 mm (D) X 500 mm (H)
Weight: Approx. 250 kg