Ellipsometers
Spectroscopic Ellipsometers
More than thin film thickness and optical constants characterization, ellipsometric analysis provide rich information on material properties: anisotropy, gradient, morphology, crystallinity, chemical composition, electrical conductivity.
Products: UVISEL VIS: 210-880 nm | UVISEL FUV: 190-880 nm | UVISEL NIR: 245-2100 nm | UVISEL ER: 190-2100 nm | UVISEL VUV: 142-880 nm
Measure thin film thickness and optical constants. For research and process development.
Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
Spectral range: 430 - 850 nm
Spectral range: 515 - 1000nm (NEW)
Easy-to-use, rapid and versatile spectroscopic ellipsometer.
For UVISEL & MM-16 Spectroscopic Ellipsometers