Ellipsometers
Spectroscopic Ellipsometers
More than thin film thickness and optical constants characterization, ellipsometric analysis provide rich information on material properties: anisotropy, gradient, morphology, crystallinity, chemical composition, electrical conductivity.
The ultimate solution to every challenge in thin film measurement
Products: UVISEL VIS: 210-880 nm | UVISEL FUV: 190-880 nm | UVISEL NIR: 245-2100 nm | UVISEL ER: 190-2100 nm | UVISEL VUV: 145-880 nm
Measure thin film thickness and optical constants. For research and process development.
Visualize your sample and measure thin film thickness and optical constants in seconds.
"With Auto SE, routine work will never be the same!"
NEW NIR Extended Spectral Range !
Versatile spectroscopic ellipsometer delivering research grade performance at an economical price.
For UVISEL Spectroscopic Ellipsometers