Spectroscopic Ellipsometers

More than thin film thickness and optical constants characterization, ellipsometric analysis provide rich information on material properties: anisotropy, gradient, morphology, crystallinity, chemical composition, electrical conductivity.

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Products: UVISEL VIS: 210-880 nm | UVISEL FUV: 190-880 nm | UVISEL NIR: 245-2100 nm | UVISEL ER: 190-2100 nm | UVISEL VUV: 142-880 nm

Measure thin film thickness and optical constants. For research and process development.

AutoSE

Visualize your sample and measure thin film thickness and optical constants in seconds.

"With Auto SE, routine work will never be the same!"

MM-16 Spectroscopic Ellipsometer

Spectral range: 430 - 850 nm

Spectral range: 515 - 1000nm (NEW)

Easy-to-use, rapid and versatile spectroscopic ellipsometer.

UVISEL VIP

Integrated Spectroscopic Ellipsometer and Spectroscopic Reflectometer

 For UVISEL & MM-16 Spectroscopic Ellipsometers