Newsletter

October 2009

  • PhotoLuminescence and PhotoReflectance Analysis of Semiconductor Devices
    In this article, we describe a combined Photoluminescence (PL) and PhotoReflectance (PR) system used to characterize High Electron Mobility Transistor (HEMT). Results include intersubband energies, Fermi-level location and 2D sheet density of the graded InxGa1-xAs channel.
  • Upgrade your existing SEM with our Cathodoluminescence (CLUE) system
    The Optical Spectroscopy Division of HORIBA Jobin Yvon is proud to introduce the new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs).
  • Find out about our Latest Spectroscopy Software SynerJY 3.0
    HORIBA Jobin Yvon (HJY) is announcing the release of our new data acquisition and analysis software – SynerJY 3.0.

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