October 2009

In this article, we describe a combined Photoluminescence (PL) and PhotoReflectance (PR) system used to characterize High Electron Mobility Transistor (HEMT). Results include intersubband energies, Fermi-level location and 2D sheet density of the graded InxGa1-xAs channel.

The Optical Spectroscopy Division of HORIBA Jobin Yvon is proud to introduce the new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs).

HORIBA Jobin Yvon (HJY) is announcing the release of our new data acquisition and analysis software – SynerJY 3.0.