AFM-Raman and TERS - Tip-Enhanced Raman Scattering

AFM-Raman, nano-Raman and TERS home

Integrate all your needs into one powerful tool

HORIBA’s Raman technology is easily coupled to scanning probe microscopes (SPM). Our fully integrated solution uses directly coupled optics optimized for high-throughput. The platform allows Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM) and confocal optical spectroscopy (Raman and fluorescence imaging) in one versatile instrument, ready for Tip-Enhanced Raman Spectroscopy (TERS) or co-localized measurements.

HORIBA partners with most leading manufacturers, including AIST-NT, Agilent Technologies, Asylum Research, Bruker Nano (formerly Veeco Instruments), JPK Instruments, Nanonics Imaging Ltd, and Park Systems.

Combine nanoscale imaging and chemical analysis

Co-localized AFM and Raman images of 1 layer, 2 layers and 3 layers graphene
  • AFM and other SPM techniques provide topographic, mechanical, thermal, electro-magnetic, and near-field optical properties with molecular resolution.
  • Confocal Raman spectroscopy and imaging provides specific chemical information about your nano-materials, with sub-micron spatial resolution.
  • A unique platform for simultaneous measurements helps you spend more time getting results with the confidence the images you get are truly correlated.
  • Combining high performance with ease of use, HORIBA offers a reliable and full-featured solution with your choice of SPM manufacturer.
  • Optics, mechanics and software are optimized for Tip-Enhanced Raman Spectroscopy (TERS) so that you too can confidently approach this technique with the assurance HORIBA’s decades of experience in Raman is behind you to support your research.

One tool, many possibilities: AFM-Raman helps you be more productive

Find your nano-objects fast!

Ultra-fast Raman mapping

Search for and locate nano-materials that are invisible through an optical microscope but can be detected by ultra-fast Raman mapping thanks to their strong and specific chemical signature, then perform topographic, mechanical, electrical or thermal analysis at the location of interest.

Cross-check your data!

Raman spectroscopy can confirm certain characteristics of a material. For example in the graphene study above, AFM topography shows poor contrast to determine layer thickness, while Raman provides another means to determine the same information, as well as provide additional details on structure and defects that would require atomic resolution to be determined with AFM.

Get chemical information on nano-structures of interest

When most of your work is in characterizing nanostructures, sometimes the physical properties are not enough. High resolution Raman confocal imaging brings you specific chemical composition that no other SPM sensor can deliver.

AFM and Raman characterization of carbon nanotubes - HORIBA

Explore the realm of TERS (Tip-Enhanced Raman Scattering)

TERS (or nano-Raman) brings you the best of both worlds: the chemical specificity of Raman spectroscopy with imaging at spatial resolution reported down to 2nm, and typically down to 10nm. This technique can be demonstrated on various samples ranging from nanotubes to DNA.

Versatile optical configurations

HORIBA’s AFM-Raman platform supports several optical schemes:

  • Inverted microscope: for transparent samples.
  • Upright microscope: for co-localized Raman or TERS with protruded tips.
  • Side/oblique illumination: best for TERS on opaque samples.
  • Multi-port and side-by-side configurations are available.

To learn more about this technology and how you can integrate all your needs into one powerful instrument, please fill out the contact form or call or email your local HORIBA Scientific representative.