| Dimension |
Up to 250 mm length |
- |
- |
| Radius of Curvature |
Down to 0.01% |
0.5% |
Calibrated Samples LTP measurements |
| Slope error |
Down to 0.1 arcsec rms |
0.2 arcsec rms |
LTP measurement Interferometer |
| Microroughness |
Down to 2 Å rms |
5 Å rms |
Micromap measurements |
| Substrate |
Silicon Zerodur Fused Silica SiC CVD |
- |
- |
| Coating |
Au Pt AlMgF Ni |
Cr binding layer |
Quartz monitoring |
| Groove Density |
Deviation less than 0.1 gr/mm |
Moiré Fringes (JY Patent) Optical control using recording layout (JY Patent) |
|
| Efficiency |
Groove depth and duty cycle ratio optimised by JY proprietary software according to required optical layout |
|
|
| Groove Depth |
+/- 5% |
+/- 10% |
AFM measurements |
| c/d Ratio |
+/- 5% |
+/- 10% |
AFM measurements |