• Skip to navigation
  • Skip to content
  • Start
  • Über HORIBA
  • Investor Relations
  • Neuigkeiten
  • Publikationen
  • Qualität & Soziales
  • Karrieren
  • Contact Us
HORIBA
Country/Region Selection
Österreich | Austria
Site search
  • Automotive Test Systems
  • Process & Environmental
  • Medical
  • Semiconductor
  • Scientific
  • Produktsuche
  • Products
  • Service & Support
  • News & Events
  • Newsletter
  • About Us
  • Feedback
Molecular & Microanalysis

Molecular & Microanalysis

  • Cathodoluminescence
  • Fluorescence
  • Photoluminescence
  • Raman Spectroscopy & AFM
  • Surface Plasmon Resonance imaging
Surface & Thin Films Characterization

Surface & Thin Films Characterization

  • AFM
  • Raman Spectroscopy
  • Ellipsometry
  • GD-OES
  • Plasma Profiling TOFMS
Particle Characterization

Particle Characterization

  • Laser Diffraction
  • Light Scattering
  • Zeta Potential
Elemental Analysis

Elemental Analysis

  • ICP-OES
  • C/S & ON/H Analyzer
  • GD-OES
  • S & Cl Analyzer
  • Sample Preparation
  • XRF Analyzer

Water Quality Analysis

  • pH
  • ORP
  • Conductivity
  • Salinity
  • Total Dissolved Solids
  • Resistivity
  • Ion
  • Dissolved Oxygen
Forensics

Forensics

  • Light Sources
  • RUVIS
  • Digital Imaging
  • AFIS & APIS
  • Raman
  • XRF Microscopy
Customized Solutions

Custom Spectroscopy Solutions

  • Modular Raman Spectrometers
  • Photoluminescence
  • Time Resolved Fluorescence
  • Microscope Accessories
  • Tunable Light Sources
  • Cathodoluminescence
  • Vacuum UV Spectroscopy
Components

Spectroscopy & Imaging

  • Spectrometers
  • Scientific Cameras
  • Mini-Spectrometers
  • Monochromators
  • Diffraction Gratings
  • Light Sources
© 1996-2019 HORIBA, Ltd. All rights reserved.
  • Impressum
  • Nutzungsbedingungen
  • Datenschutzerklärung
  • Erreichbarkeit
  • Seitenübersicht
  • Suchen