Metals

Analytical Needs for Metals

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In the realm of advanced materials, primary metals are critical for fields such as aerospace, automotive, electronics, and medical devices. Ensuring the quality and performance of these metals requires extensive analysis.

Elemental Analysis

Elemental analysis of metals involves a suite of advanced techniques to determine the composition, distribution, and depth profile of elements within metal samples, providing critical insights for applications in material science, manufacturing, and quality control.

Depth Profiling

By providing detailed information about the distribution of elements as a function of depth, Glow Discharge Optical Emission Spectroscopy (GDOES) is ideal for trace element analysis and analysis of metal coatings, and helps in understanding material properties, improving manufacturing processes, and ensuring quality control.

Distribution Analysis

Single-, multi-point elemental analysis and elemental mapping analysis can be performed using µ-XRF, which focuses X-rays and enables elemental analysis of small areas.

Structural Analysis

Raman spectroscopy and other spectroscopic techniques can be used to analyze the crystal structure and microstructure of metal oxides and metal complexes which are easily distinguished by their characteristic spectra.

Surface Analysis

Atomic Force Microscopy (AFM) can assess surface roughness, coatings, and treatments to ensure proper adhesion, corrosion resistance, and overall surface integrity.

    HORIBA Solutions

    HORIBA provides advanced analytical instruments and solutions that significantly aid in the analysis of metals.

    EMIA-Expert
    EMIA-Expert

    Carbon/Sulfur Analyzer
    (Flagship High-Accuracy Model)

    EMGA-Expert
    EMGA-Expert

    Oxygen/Nitrogen/Hydrogen Analyzer
    (Flagship High-Accuracy Model)

    GD-Profiler 2™
    GD-Profiler 2™

    Pulsed-RF Glow Discharge Optical Emission Spectrometer

    XGT-9000
    XGT-9000

    X-ray Analytical Microscope (Micro-XRF)

    Partica LA-960V2
    Partica LA-960V2

    Laser Scattering Particle Size Distribution Analyzer

    nanoPartica SZ-100V2 Series
    nanoPartica SZ-100V2 Series

    Nanoparticle Analyzer

    LabRAM Soleil
    LabRAM Soleil

    Raman Spectroscope - Automated Imaging Microscope

    SignatureSPM
    SignatureSPM

    Scanning Probe Microscope with Chemical Signature

    SA-9600 Series
    SA-9600 Series

    BET Flowing Gas Surface Area Analyzers

    EMIA-Pro
    EMIA-Pro

    Carbon/Sulfur Analyzer (Entry Model)

    EMGA-Pro
    EMGA-Pro

    Oxygen/Nitrogen Analyzer (Entry Model)

    PSA300*
    PSA300*

    Static Image Analysis System Particle Size

    ViewSizer 3000
    ViewSizer 3000

    Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)

    MESA-50
    MESA-50

    X-Ray Fluorescence Analyzer

    XploRA™ PLUS
    XploRA™ PLUS

    MicroRaman Spectrometer - Confocal Raman Microscope

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