Programmable autosampler with random access and up to 360 samples in position. Choice of a variety of racks and ability to work with user-defined racks and trays.
Extension to 120nm for far UV analysis of the halogen elements or the use of alternative wavelengths.
Provides fast, full spectrum acquisition on any HORIBA Scientific sequential ICP-OES spectrometer. Automatic semi-quantitative analysis for all elements without calibration, retrospective analysis and automatic identification of unknown elements.
Nitrogen generation from air for the purge of ICP-OES spectrometers. Purge improves sensitivity for wavelengths below 190nm and extends the lifetime of the optics.
Safe, environmental friendly and controlled mean of cooling the torch coil and the RF generator.
Improve your instruments sensitivity up to a possible order of magnitude with the USN.
Minimize clogging phenomenon of the nebulizer and sample deposition in the injector capillary by saturating the nebulizer Argon flow with water.
Concomitant Metals Analyzer (CMA) hydride generation system provides simultaneous analysis of hydride and non-hydride elements without sample pre-treatment. Detection limits of 10 to 20 times improvement are seen for the hydride elements and 50 times improvement for Hg.
Add a simultaneous optic to a HORIBA Scientific sequential system to create a combination ICP OES system with enhanced sample throughput.
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