Yukihiro Ozaki (Prof. Ozaki) was born in Sakai, Osaka, Japan in 1949.

Prof. Ozaki graduated from Osaka University in 1973 with B.S degree in chemistry. He also obtained his M.S (1975) and Ph.D. (1978) in chemistry from Osaka University. After he spent for two years and a half at National Research Council, Canada as a research associate, he joined the Jikei University School of Medicine in Tokyo in 1981. In 1989 he moved to Kwansei Gakuin University as an associate professor of Chemistry Department. Currently, he holds a position of professor in the Department of Chemistry, School of Science and Technology. Since April 2013, Prof. Ozaki has been Vice president of Kwansei Gakuin University. He is also President of the Spectroscopical Society of Japan.

He was a senior research fellow of Princeton University in 1993. Currently, he is an honorary professor of Jilin University and Changchung Institute of Applied Chemistry, Chinese Academy of Science. Prof. Ozaki is an associate Editor of Applied Spectroscopy and a member of the editorial board of Journal of Raman Spectroscopy, Journal of Molecular Structure, and Vibrational Spectroscopy.

Prof. Ozaki’s research program has been concerned with basic studies and applications of far ultraviolet (FUV), infrared (IR), Raman, and near-infrared (NIR) spectroscopy.  His spectroscopy research covers from the development of new type of instruments such as an ATR-FUV spectrometer, basic studies of physical phenomena like a study on mechanism of surface-enhanced Raman scattering to applications involving those to polymers, nano materials, and biological samples. His research interests also involve the developments spectral analysis methods such as two-dimensional correlation spectroscopy and chemometrics.

Prof. Ozaki received many awards including the 1998 Tomas Hirschfeld Award, the 2001 EAS Award for Achievements in Near Infrared Spectroscopy, the Spectroscopical Society of Japan Award (2002), the 2005 Science and Technology Award of Japanese Government (Ministry of Education, Culture, Sports, Science and Technology), and Gerald Birth Award of International Conference Diffuse Reflectance Spectroscopy, the Japan Society for Analytical Chemistry Award (2008), Gold Medal Award of Wroclaw University, Poland (2009), Changbai Mountain Friendship Award from Jilin Province, China (2010) and Bomen Michelson Award, USA (2014).

Tip-enhanced Raman Scattering Study of Graphenes

Tip-enhanced Raman Scattering (TERS) spectroscopy is a technique that employs near-field enhancement from a metallic nanotip to obtain Raman Spectra with spatial resolution surpassing the diffraction limit. To achieve a good enhancement, the size, shape, and material of the tips must be carefully chosen to ensure Plasmon resonance with the excitation laser light. The evanescent field from this resonance is confined to a small area around the tip, resulting in the improvement of spatial resolution. This characteristic of TERS is very useful in grapheme studies.

We developed a bulk silver tip-enhanced Raman scattering (TERS) and obtain TERS spectra of epitaxial graphene on the carbon face of 4H-SiC (000-1) with a high signal-to noise ratio.1 Thanks to the high quality of TERS spectra we firstly find that the G band in the TERS spectra exhibits position-by-position variations in both lower wavenumber shifts and spectral broadening. The analysis of the variations reveals that the shifts and broadenings have a linear correlation between each other, indicating that the variations are induced by the position dependent local stress on graphene based on a uniaxial strain model.1

As the second study,2 step, ridge, and crack submicro/ nanostructures of epitaxial graphene on 4H-SiC (000-1) were characterized using tip-enhanced Raman scattering (TERS). The results of this TERS study illustrate that the exceptional spatial resolution of TERS allows spectroscopic measurements of individual nanostructures, a feat which normal Raman spectroscopy is not capable of. By analyzing TERS spectra, the change of local strain on the nanoridge and decreased graphene content in the submicrometer crack were detected.

1. Suzuki, T.; Itoh, T.; Vantasin, S.; Minami, S.; Kutsuma, Y.; Ashida, K.; Kaneko, T.; Morisawa, Y.; Miura, T.; Ozaki, Y, Phys. Chem. Chem. Phys. 2014, 16, 20236-20240.
2. Vantasin, S.; Tanabe, I.; Tanaka, Y.; Itoh, T.; Suzuki, T.; Kutsuma, Y.; Ashida, K.; Kaneko, T.; Ozaki, Y, J. Phys. Chem. C 2014, 118, 25809-25815.