椭圆偏振仪
表面分析
- Determination of the Refractive Index of Y2O3 on Glass and
- Spectroscopic Ellipsometry study of ZnO thin films
- Standard Applications by Spectroscopic Ellipsometry
- Characterisation of TiO2 Thin Films and Multilayer Antireflective Coatings by Spectroscopic Ellipsometry
- Characterisation of ZrO2 Thin Films on Glass Substrates by Spectroscopic Ellipsometry
- Characterisation of ZrO2 Thin Films on Glass Substrates
- Characterisation of TiO2 Thin Films and Multilayer Antireflective Coatings
- Characterisation of DNA Sensor Pads using the UVISEL Spectroscopic Phase Modulated Ellipsometer
- Determination of the Refractive Index of Y2O3 on Glass and Pre-evaporated Substrates by Spectroscopic Ellipsomeetry
- Characterization of Barrier Layers by Spectroscopic Ellipsometry for Packaging Applications
- Characterization of Electrochromic Devices by Spectroscopic Ellipsometry
- Characterzation of GeSbTe films by Spectroscoplc Ellipsometry for Rewritable Optical Discs
- Thin Films & NanoMaterials Characterization by Spectroscopic Ellipsometry
