• System: LabRAM HR Evolution
  • Time per point: 100 ms
  • Step size: 0.2 µm
  • Data points: 20,574

SWIFT™ ultra-fast Raman imaging of a Silicon wafer allows the crystal structure of the semiconductor material to be distinguished. In this example, the image shows the distribution of crystalline, poly-crystalline and nano-crystalline regions of Silicon.  The Raman image is superimposed onto the optical image of the sample.