XploRA™用于Raman-AFM联用
XploRA™用于Raman-AFM联用

拉曼和原子力显微镜(AFM)的联用开辟了一个备受关注的新功能,并且可以在样品成分和结构方面提供新的信息。拉曼-原子力显微镜联用系统可以在纳米尺度提供样品形貌信息,再结合拉曼图像中获得的化学信息,可以对样品进行更加全面的表征。

Raman-AFM联用系统中也可以应用TERS和近场光学显微镜(SNOMNSOM)之类的技术,打开纳米拉曼世界。

原子力显微镜系统应用于生物、半导体和纳米材料时,对于不同的应用会对仪器的性能有一些不同的要求或需要进行一些优化。HORIBA Scientific能够提供最好的拉曼系统与最好的原子力显微镜联用——几乎所有厂家生产的原子力显微镜都可以和我们的拉曼系统联用。

点击查看一些典型的配置

 

利用金包覆的针尖以接触模式获得的碳纳米管AFM图像,纳米管束的直径大约在10-30 nm之间。

Cross-check your data!

Raman spectroscopy can confirm certain characteristics of a material. For example in the graphene study above, AFM topography shows poor contrast to determine layer thickness, while Raman provides another means to determine the same information, as well as provide additional details on structure and defects that would require atomic resolution to be determined with AFM.

Get chemical information on nano-structures of interest

When most of your work is in characterizing nanostructures, sometimes the physical properties are not enough. High resolution Raman confocal imaging brings you specific chemical composition that no other SPM sensor can deliver.

AFM and Raman characterization of carbon nanotubes - HORIBA

Explore the realm of TERS (Tip-Enhanced Raman Scattering)

TERS (or nano-Raman) brings you the best of both worlds: the chemical specificity of Raman spectroscopy with imaging at spatial resolution reported down to 2nm, and typically down to 10nm. This technique can be demonstrated on various samples ranging from nanotubes to DNA.

Versatile optical configurations

HORIBA’s AFM-Raman platform supports several optical schemes:

  • Inverted microscope: for transparent samples.
  • Upright microscope: for co-localized Raman or TERS with protruded tips.
  • Side/oblique illumination: best for TERS on opaque samples.
  • Multi-port and side-by-side configurations are available.