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首页 » Scientific Products Surface & Thin Films Characterization

Surface & Thin Films Characterization

Ellipsometry

Spectroscopic Ellipsometry

  • Spectroscopic Ellipsometers
  • In-Situ & In-Line
  • Large Area Measurements
GD-OES

GD-OES

AFM

AFM-Raman

Raman

Raman Spectroscopy

  • Spectrometers
  • Raman Imaging
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