微区X射线荧光元素分析仪

See us at

  • Biophysical Society,  27 Feb - 2 March 2016, Los Angeles, CA, USA
  • ACS Spring, 13 - 15 March 2016, San Diego, CA, USA
  • Water Quality Technology Conference(WQTC), 13  - 17 November 2016, Indianapolis, Indiana

X射线荧光

HORIBA公司的XGT系统是高品质的能量色散型X射线荧光分析仪。

与传统的X射线多毛细管相比,专利的XGT(X射线导管)技术提供了更加微小的X射线束斑。从高强度的3mm X射线束到10 µm X射线束扩展了仪器的分析能力。

不但可以对样品的元素进行定性定量分析,还可以通过面扫描功能获得样品的元素面分布图。

HORIBA公司X射线荧光技术正在法医、地质、生物/医药、电子电器、考古、发动机磨损和RoHs/ELV条例等领域得到广泛的应用


XRF Micro-Analysis

The unique XGT micro-XRF instruments provide unparalleled elemental analysis performance with spatial resolutions down to 10 µm. These systems provide a complete elemental analysis solution, including qualitative and quantitative characterisation via single point analysis, automated multi-point analysis and fast XRF imaging. Unique dual vacuum modes allow "high sensitivity" and "atmospheric pressure" analysis of all elements from sodium to uranium.

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RoHS and ELV Analysis

XRF analysis is widely used for fast, non-destructive screening of manufacturing materials and parts for RoHS and ELV compliancy. The MESA-50 offer high sensitivity analysis for the eight restricted elements (Pb, Cd, Hg, Cr, Br, Cl, Sb, As). The standard 1.2 mm analysis beam allows individual cables and components to be accurately analysed, without risk of false pass/fail results.

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