Instruments

GD-Profiler

The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterization and process studies.

Plasma Profiling TOFMS™

Plasma Profiling TOFMS™ - Discover a Whole New World of Information

This new instrumentation combines the speed of the GD plasma sputtering process with the rapidity and sensitivity of a Time of Flight Mass Spectrometer.