Applications

Foreign Particle Analysis on Separator Film

The XGT-9000 Series can detect and determine the composition of foreign particles, and therefore track the source of contamination. The particle detection function within the XGT-9000 Series makes it possible to count the number of particles, characterize particle sizes, and get the coordinate position of particles to re-analyze them in detail.

Sample: Foreign particle on the separator

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X-ray Analytical Microscope (Micro-XRF)

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