Articles

Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films.

Gerald Ndong, Angel Lizana, Enric Garcia-Caurel, Valerie Paret, Géraldine Melizzi, Denis Cattelan, Bernard Pelissier, and Jean-Hervé Tortai. Applied Optics, Vol. 55, Issue 12, pp. 3323-3332 (2016), doi: 10.1364/AO.55.003323