Material Science

For non-destructive thin film characterization in material research, ellipsometers enable users to characterize thin film thickness, optical constants and many other material properties of nano and micro layers.

Application Notes

  • SE-09:Characterization of Aluminum Anodized Surfaces using the MM-16 Spectroscopic Ellipsometer
  • SE-11:Standard applications by Spectroscopic Ellipsometry
  • SE-14:Characterization of barrier layers by Spectroscopic Ellipsometry for packaging applications
  • SE-19:Characterization of GeSbTe films by Spectroscopic Ellipsometry for Rewritable Optical Discs
  • SE-29:Ellipsometric characterization of doped and undoped crystalline diamond structures
  • SE-32:Characterization of SiO2 on glass by Spectroscopic Ellipsometry
  • SE-35: An Ellipsometric Study of the Optical Constants of C60 & C70 Thin Films
  • SE-36: Ellipsometric characterization and modeling of different types of nanoparticles
  • SE-37: Measuring Liquids with a New Accessory on UVISEL Spectroscopic Ellipsometers

For a list of all available application notes please click here.

Ellipsometry for Organic Webinar