Nano-materials Characterization

Nano Technology Products

HORIBA Scientific is one of the world's largest manufacturers of spectroscopic systems and metrology products. We provide complete solutions for nano-materials analysis, characterization and nanotech research. Nano researchers can now exploit the key tools of Raman, Fluorescence and Ellipsometry to probe the composition, chirality, band gap and thickness of the new generation of functional nanomaterials. Whether you're working with single-wall carbon nanotubes (SWCNT), quantum dots, nanoparticles, nanocrystals, or bio-nano materials there is a Raman, Fluorescence or Ellipsometry system to take your nanotechnology research to a new level.

Raman Microscopy

The HORIBA Scientific range of Raman spectrometers and microscopes offer the highest level of performance. True confocality provides the highest definition images, multi-wavelength operation gives access to the broadest range of samples and high resolution options probe subtle phase and structural properties.

  • Nano-materials - SWCNT, Boron Nitride, breathing mode, chirality, purity
  • Polymers - homogeneity and phase
  • SAM and LB films - structure and composition
  • True confocality
  • High resolution
  • Multi-wavelength
  • Raman and NIR PL
  • Combined micro Raman and FTIR
  • Raman at extreme conditions

Click here for more information on the Automated Raman
Click here for more information on the High Resolution Raman
Click here for more information on the High Performance Raman

Fluorescence

With the range of spectrofluorimeters from HORIBA Scientific you can explore an increasing number of materials and applications. Versatile and high performance equipment does not limit the scope and depth of analysis.

  • Fluorescence excitation
  • PLE
  • Steady-state
  • Lifetime
  • Micro-spectroscopy
  • Quantum yield
  • Bio-molecules
  • Nanotube dimensions
  • Proteins
  • Quantum Dots
  • Tags and markers
  • Low temperature

Click here for more information on Fluorescence
Click here for more information on the NanoLog

Ellipsometry

The MM-16 spectroscopic ellipsometer enhances the capabilities of classical ellipsometry for the characterization of thin film thickness and optical properties. Exceptionally high accuracy and simplicity provide fast and robust sample analysis. This is only the starting point for the MM-16! The instrument delivers a complete solution for both standard and advanced film and device characterization.

  • Thick to ultra-thin films
  • Multilayer structures
  • Biomedical devices
  • Display structures
  • Metal films
  • Bio-membranes
  • Films with low index contrast
  • Plastics and polymers
  • Optical coatings
  • Nanomaterials
  • Liquid crystal structures
  • Solid/liquid and liquid/liquid interface

Click here for more information on Ellipsometry
Discover also the new Auto SE for routine film measurement & control

Particle Size Analysis

HORIBA LB550 dynamic light scattering range, is an answer to all your nanomaterials particle size characterization from nm to micron scale. Emulsions or suspensions can be analysed within a large range of concentration without dilution. It’s unique built-in viscometer probe guarantee a high degree of accuracy requested in such field.

A large number of applications are covered by this technique, such as:

  • Inks, painting pigments
  • Ceramics, material sciences
  • Cosmetics, Pharmaceuticals
  • Bio materials
  • Polymers
  • Food

Click here for more information on Particle Size Analysis
Click here for more information on the LB-550