
Raman-Spektroskopie
Semiconductor
Application Notes

- RA39 : Strain measurements of a Si cap layer deposited on a SiGe substrate determination of Ge content.
- Semiconductor02 : Strained Si for Sub-100nm MOSFETs.
- RA42 : Raman Imaging of a Single Gallium Nitride Nanowire.
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Articles
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