HORIBA Scientific, a global leader in the production of high-performance spectroscopy systems and solutions, is proud to be hosting a joint webinar with Covalent Metrology on Thursday, December 2nd at 2PM EDT.
The presentation, entitled, “Fast Characterization of nm Thin to Thick Coatings using Pulsed-RF Glow Discharge Optical Emission Spectrometry,” will show this technique’s ability to characterize both conductive and non-conductive layers and coatings from nm to 100+ microns thickness.
After reviewing the theory and the instrument configuration, this presentation will be focused on a large variety of applications, including Li Ion Batteries, Energy Storage, Photovoltaics, PVD, CVD and Organic Coatings, Platings, Thin and Thick Oxides, Failure Analysis and more.
HORIBA Scientific has partnered with Covalent Metrology, a leading North American provider of analytical services, to expand engineering and scientific access to world-class expertise and chemical analysis instruments. In addition to co-hosting this webinar, Covalent and HORIBA have opened the HORIBA Scientific North American Demonstration Lab at Covalent’s Silicon Valley headquarters. This showroom is HORIBA’s first demonstration lab with a partner in North America and adds to our application / demo labs in our corporate offices. The lab will showcase top-of-line spectroscopy solutions, and bolster the companies’ mutual efforts to develop methods for new chemical analysis applications. With access to new, cutting-edge instruments from HORIBA, Covalent’s team of experts will be better able to support clients with more accurate and powerful chemical analysis capabilities.