Ellipsometric Characterization and Modeling of Different Types of Nanoparticles

AFM picture of composite layer of Gold nanoparticles into PVA matrix.

AFM picture of composite layer of Gold nanoparticles into PVA matrix.

UVISEL ellipsometers have been used for the characterization of several systems of nanoparticles. This ellipsometric characterization involves the development of specific modeling tools available within DeltaPsi2 software.

Nanoparticles are of great scientific interest as they are a bridge between bulk materials and atomic or molecular structures. A bulk material should have constant physical properties regardless of its size, but at the nano-scale size-dependent properties are often observed. Thus, the properties of materials change as their size approaches the nanoscale.

Nanoparticles, defined as particle of any shape with dimension in the 1 to 100 nm range, often possess unexpected optical properties as they are small enough to confine their electrons and can produce specific so called plasmonic effects. For example, gold nanoparticles appear deepred in solution.

Another example relates to absorption of solar radiation that is much higher in materials composed of nanoparticles than it is in thin films of continuous material. One should also mention the trends of photonic crystals or optical metamaterials and their promising properties where ordered structures are achieved by arrangement of nanostructures. Thus, in many applications, controlling the size and shape of the particles, is of crucial importance.

This note illustrates the characterization of several systems of nanoparticles with UVISEL ellipsometers. This characterization involves modeling tools available within DeltaPsi2.

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Ellipsometric Characterization and Modeling of Different Types of Nanoparticles
DescriptionUVISEL ellipsometers have been used for the characterization of several systems of nanoparticles. This ellipsometric characterization involves the development of specific modeling tools available within DeltaPsi2 software. Through this report we illustrate the application of ellipsometry to the characterization of nanoparticle based samples. Our goal is to demonstrate that the technique can apply within a large panel of materials science. The HORIBA ellipsometric product line offers the most versatile hardware of the UVISEL series combined with the DeltaPsi2 software including unique modeling features to get the most of your applied work on this fascinating domain of modern physics.
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