Structural characterization of WS₂ flakes by Photoluminescence and ultra-low frequency Raman spectroscopy on a unique multimode platform

Structural characterization of WS₂ flakes by Photoluminescence and ultra-low frequency Raman spectroscopy on a unique multimode platform

Structural characterization of WS₂ flakes by Photoluminescence and ultra-low frequency Raman spectroscopy on a unique multimode platform

2D materials are state-of-the-art in nano- and opto-electronics. Characterizing their structural properties with a non-destructive approach at the micron scale is very important. We demonstrate in this paper how LabRAM Soleil™ confocal Raman multimode microscope is the perfect tool for these materials characterization.

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