Graphene Studies Using Raman Spectroscopy

A Raman map of a graphene sample on a SiO2/Si substrate performed using the XploRA Raman spectrometer with a 532 nm laser excitation: Multivariate analysis.

Raman image of graphene bi-layer (in green), multi-layer graphene (in red), edges (in pink) and SiO2/Si substrate (in blue).

The novel advanced material, Graphene, first report in Science in 2004, consists of single molecular layers of highly crystalline graphite. It is the basic structural element of some carbon allotropes including graphite, carbon nanotubes and fullerenes.

Distinguishing the number of graphene layers as well as quantifying the impact of disorder on its properties is critical for the study of graphene-based devices. Raman micro spectroscopy has proven to be a convenient and reliable technique for determining both of these properties.

The high structural selectivity of Raman spectroscopy, combined with both spectral and spatial resolution as well as the non-destructive nature of this technique make it an ideal candidate as a standard characterisation tool in the fast growing field of graphene.

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Graphene Studies using Raman Spectroscopy
DescriptionGraphene is a new nanomaterial which may partially replace silicon in microcircuits and computer chips in the future. In order to better understand its quality characteristics, fast reliable techniques that deliver the right property measures are needed. Raman spectroscopy has emerged as a key technique for studying this exceptional material.
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